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GTL Microwave Probes were developed to provide superior electrical performance and unparalleled durability when used for probing on wafer, package, BGA, PCB, Socket, backplane, high density interconnect, etc. GTL Probes have a high tolerance, and the ruggedized probe tips allow them to land repeatedly, and take high quality data.
The GTL4040 is a very popular probe station designed for single-sided measurements on small and medium-sized test boards as well as sockets, connectors and device packages. The GTL 4040 comes with 1 of 2 options for Microscope configuration: The Microscope Bridge or the Free Motion Arm. Please view the photos to see the differences.
GTL Micropositioner provides accurate and precise mechanical performance for probe placement on a Device Under Test. The GTL Micropositioner is the most popular Probe Station accessory and comes in 2 styles, East and West, to affix to both sides of the Probe Station. The Micropositioner axes controls have a true 1-to-1 movement without backlash and a 1-inch range of motion.
This is our other popular Nose, the North South Nose. The Probe Bracket is placed perpendicular to the nose, so the probe is facing the north or south directions. The North South Nose has a reverse version so the probes are on the opposite side(see photos to the left). This prom Also somes with a rotational adjustment for probe planarity.
For popular high speed components like semiconductor packages, and test contactors, we have developed a custom test fixture which allows the use of high bandwidth microprobes to measure virtually any I/O pin, according to GigaTest's methodology and requirements. These fixtures are typically 2-layer, or multi-layer precision PCBs, with mounting pads for attaching the DUT.
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