COMPANY MISSION Our objective at MEE is to work in tandem with customers to evolve practical, cost-effective solutions to materials-related problems. MEE achieves this by the innovative application of traditional and advanced analytical methods combined with sound engineering. The MEE technical team specializes in comprehensive, root-cause failure analysis.
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The Handbook of Analytical Methods for Materials (HAMM) is a brief tutorial on techniques for materials characterization. The HAMM is intended to provide our visitors with enough information on a technique to determine whether it has the potential to help solve a materials problem. MEE strives to provide high-quality, accurate and timely laboratory and engineering consulting services.
The Handbook of Analytical Methods for Materials (HAMM) is a brief tutorial on techniques for materials characterization. The HAMM is intended to provide our visitors with enough information on a technique to determine whether it has the potential to help solve a materials problem. Our technical staff has experience with metals from aluminum to zinc, as well as polymers and ceramics.
The Handbook of Analytical Methods for Materials (HAMM) is a brief tutorial on techniques for materials characterization. The HAMM is intended to provide our visitors with enough information on a technique to determine whether it has the potential to help solve a materials problem. MEE has multiple Scanning Electron Microscopes with different capabilities to meet almost every challenge.
The Handbook of Analytical Methods for Materials (HAMM) is a brief tutorial on techniques for materials characterization. The HAMM is intended to provide our visitors with enough information on a technique to determine whether it has the potential to help solve a materials problem. The FESEM is an advanced microscope offering increased magnification and the ability to observe very fine features at a lower voltage than the SEM found in most laboratories.The Field Emission Scanning Electron Microscope (FESEM) has a much brighter electron source and smaller beam size than a typical SEM increasing the useful magnification of observation and imaging up to 500,000x.
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